Comparison of Techniques for Measuring Recombination Lifetime in Photovoltaic Materials: Trapping Effects

MRS Online Proceedings Library volume 974, Article number: 101 (2006) Cite this article

Abstract

Here we will compare four techniques that are commonly used for diagnosis of the lifetime of photovoltaic materials. The strengths and weaknesses of these techniques will be shown and discussed.

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Author information

Affiliations

  1. Measurements and Characterization Division, National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO, 80401, USA

    Richard K. Ahrenkiel, Steven W. Johnston & Wyatt K. Metzger

  2. Department of Physics and Astronomy, University of Denver, 2112 E. Wesley Ave., Denver, CO, 80208, USA

    Richard K. Ahrenkiel

Authors
  1. Richard K. Ahrenkiel
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  2. Steven W. Johnston
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  3. Wyatt K. Metzger
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Correspondence to Richard K. Ahrenkiel.

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Ahrenkiel, R.K., Johnston, S.W. & Metzger, W.K. Comparison of Techniques for Measuring Recombination Lifetime in Photovoltaic Materials: Trapping Effects. MRS Online Proceedings Library 974, 101 (2006). https://doi.org/10.1557/PROC-0974-CC01-01

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