Abstract
Here we will compare four techniques that are commonly used for diagnosis of the lifetime of photovoltaic materials. The strengths and weaknesses of these techniques will be shown and discussed.
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R. K. Ahrenkiel and S. W. Johnston, Materials Science and Engineering B102,161–172 (2003).
Metzger, W.K.; Albin, D.; Levi, D.; Sheldon, P.; Li, X.; Keyes, B.M.; Ahrenkiel, R.K, J. of Appl. Phys, 1 Sept. 2003; V 94, no. 5, p 3549–55;
R. K. Ahrenkiel in “Minority Carriers in III-V Semiconductors: Physics and Applications”, SEMICONDUCTORS AND SEMIMETALS-V39 (Willardson Beer series; Academic Press, (1993), pp. 39–150.
R. K. Ahrenkiel, B. M. Keyes, G. B. Lush, M. R. Melloch, M. S. Lundstrom, and H. F. MacMillan, J. Vac. Sci. Technol. A 10, 990 (1992).
R. A. Sinton and A. Cuevas, Appl. Phys. Lett. 69, 2510 (1996).
M. Kunst and G. Beck, J. Appl. Phys. 60, 3558 (1986).
H. M’Saad, G. J. Norga, J. Michel, and L. C. Kimmerling, AIP Conference Proceedings 306, 471 (1994). AIP Press, New York, R. Noufi and H. Ullal, eds.
R. K. Ahrenkiel and S. W. Johnston (submitted for publication).
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Ahrenkiel, R.K., Johnston, S.W. & Metzger, W.K. Comparison of Techniques for Measuring Recombination Lifetime in Photovoltaic Materials: Trapping Effects. MRS Online Proceedings Library 974, 101 (2006). https://doi.org/10.1557/PROC-0974-CC01-01
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DOI: https://doi.org/10.1557/PROC-0974-CC01-01