Skip to main content
Log in

Characterization of Alumina Optical Waveguides Grown by Ion Beam Assisted Deposition for SPARROW Biosensors

  • Published:
MRS Online Proceedings Library Aims and scope

Abstract

Dielectric optical films with minimal surface roughness are required for biosensing applications since the coupling characteristics often used in signal transduction are dependent on the quality of the waveguides. This paper describes the fabrication and characterization of alumina-based optical waveguides for biomolecular detection devices. Alumina (Aluminum Oxide) Al2O3 waveguides were chosen for their moisture stability and refractive index. Planar alumina optical waveguides were deposited on Borofloat substrates by a vacuum evaporation process using an ion beam assisted deposition technique. The deposited films showed RMS roughness of 0.3 nm - 0.5 nm and a range of refractive indices varying from 1.62 to 1.654 as a function of varying ion beam parameters such as oxygen flow rates and drive currents. The propagation losses for the TE0 (Transverse Electric) mode of the alumina films at 632.8 nm wavelength were found to vary between 2 dB/cm ñ 6 dB/cm at a wavelength of 632.8 nm for TE0 polarization as a function of ion beam parameters. It is shown that these factors influence the optical film quality and hold the potential for achieving further waveguide performance improvement for biosensing applications.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. D. Lloyd, L. A. Hornak, S. Pathak, D Morton, and I. Stevenson, “Application of Ion Beam Assisted Thin Film Deposition Techniques to the Fabrication of a Biosensor Chip With Fieldability Potential for Important Biohazard Detection Applications” 47th Annual Technical Conference Proceedings, Soc. of Vac. Coaters, ISSN 0737-5921 (2004).

  2. T. S. Eriksson, A. Hjortsberg, G.A. Niklasson, and C. G. Granqvist, “Infrared optical properties of evaporated alumina films” Applied Optics, 20 (15), 2742 (1981).

    Google Scholar 

  3. Quan Li, Yuan-Hsin Yu, C. Singh Bhatia, L. D. Marks, S. C. Lee, Y. W. Chung, “Low-temperature magnetron sputter-deposition, hardness, and electrical resistivity of amorphous and crystalline alumina thin films,” J. Vac. Sci. Technol A , 18 (5) 2333 (2000).

    Google Scholar 

  4. Douglas A. P. Bulla, Wei-Tang Li, Christine Charles, Rod Boswell, Andrian Ankiewicz, and John Love, “Deposition and characterization of silica based films by helicon-activated reactive evaporation applied to optical waveguide fabrication” Applied Optics, 43 (14), 2978 (2004).

    Google Scholar 

  5. J. R. Nightingale, T. Cornell, P. Samudrala, P. Poloju, L. A. Hornak, D. Korakakis, “Reactive Deposition of Dielectrics by Ion Beam Assisted E-beam Evaporation,” MRS Fall 2006 Conference Proceedings.

  6. Samudrala, P. “Optical Characterization of Alumina Waveguides and SPARROW Biosensor Modeling,” Master’s Thesis, West Virginia University (2006).

  7. Q.Zabeida, J. E. Klemberg-Saphieha, L. Martinu, and D.Morton, “Ion Bomabardment Characteristics During the Growth of Optical Films Using a Cold Cathode Ion Source,” http://www.dentonvacuum.com.

  8. Katsuhiro Yokota, Kazuhiro Nakamura, Tomohiro Sasagawa, Toshihiko Kamatani, Fumiyoshi Miyashita, “An Oxygen Ion Dose Dependence of Dielectric Constant and Surface Roughness of Titanium Oxide Films Deposited on Silicon by an Ion Beam Assisted Deposition Technique,” IEEE Trans. 2000 High-Technology Research Center and Faculty of Engineering, Kansai University, Faculty of Informatics, Kansai Unversity.

  9. Yadun Zhaoa, Yitai Oian, Weicao Yua and Zuvao Chena, Department of Applied Chemistry, Structure Research Laboratory, University of Science and Technology of China, “Surface roughness of alumina films deposited by reactive r. f. sputtering,” http://www.sciencedirect.com

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

About this article

Cite this article

Poloju, P., Samudrala, P.K., Nightingale, J.R. et al. Characterization of Alumina Optical Waveguides Grown by Ion Beam Assisted Deposition for SPARROW Biosensors. MRS Online Proceedings Library 967, 512 (2006). https://doi.org/10.1557/PROC-0967-U05-12

Download citation

  • Published:

  • DOI: https://doi.org/10.1557/PROC-0967-U05-12

Navigation