HRTEM and EELS Studies of GdSi2 Nanostructures Grown by Self-Assembly

MRS Online Proceedings Library volume 901, Article number: 239 (2005) Cite this article

Abstract

There has been considerable interest in the properties of rare earth metal nanostructures grown epitaxially on Si(001) surfaces. The questions arises as to what extent the nanometer scale lateral dimensions (width and thickness) affect the material properties. We compare thin film Gd silicide samples with Gd nanostructures grown on Si(001) using high resolution transmission electron microscopy (HRTEM). The nanostructures have the same orthorhombic crystal structure as the thicker silicide films. Electron energy loss spectroscopy measurements from metallic Gd and the thin film silicides are also shown as references for similar measurements on the nanostructures.

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Affiliations

  1. Department of Chemical Engineering and Materials Science, Michigan State University, East Lansing, MI, 48824-1226, USA

    Jiaming Zhang, Gangfeng Ye & Martin A. Crimp

  2. Department of Physics and Astronomy, Michigan State University, East Lansing, MI, 48824-1226, USA

    R. Loloee

  3. Department of Materials Science and Engineering, University of Toronto, 184 College St, Toronto, ON, M5S 3E4, Canada

    Jun Nogami

Authors
  1. Jiaming Zhang
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  2. Gangfeng Ye
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  3. R. Loloee
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  4. Martin A. Crimp
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  5. Jun Nogami
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Correspondence to Jiaming Zhang.

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Zhang, J., Ye, G., Loloee, R. et al. HRTEM and EELS Studies of GdSi2 Nanostructures Grown by Self-Assembly. MRS Online Proceedings Library 901, 239 (2005). https://doi.org/10.1557/PROC-0901-Ra22-39-Rb22-39

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