HRTEM and EELS Studies of GdSi2 Nanostructures Grown by Self-Assembly

Abstract

There has been considerable interest in the properties of rare earth metal nanostructures grown epitaxially on Si(001) surfaces. The questions arises as to what extent the nanometer scale lateral dimensions (width and thickness) affect the material properties. We compare thin film Gd silicide samples with Gd nanostructures grown on Si(001) using high resolution transmission electron microscopy (HRTEM). The nanostructures have the same orthorhombic crystal structure as the thicker silicide films. Electron energy loss spectroscopy measurements from metallic Gd and the thin film silicides are also shown as references for similar measurements on the nanostructures.

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Correspondence to Jiaming Zhang.

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Zhang, J., Ye, G., Loloee, R. et al. HRTEM and EELS Studies of GdSi2 Nanostructures Grown by Self-Assembly. MRS Online Proceedings Library 901, 239 (2005). https://doi.org/10.1557/PROC-0901-Ra22-39-Rb22-39

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