Organic molecular-beam deposition of perylene on Cu(110): Results from near-edge x-ray absorption spectroscopy, x-ray photoelectron spectroscopy, and atomic force microscopy

Abstract

The growth of the polycyclic aromatic hydrocarbon perylene on (110) oriented copper substrates has been studied by means of x-ray photoelectron spectroscopy, near-edge x-ray absorption spectroscopy, and atomic force microscopy. In the monolayer regime, the molecules are orientated with their molecular plane parallel to the substrate, whereas they adopt a tilted arrangement in multilayer films. For multilayers with thicknesses exceeding 10 nm, the molecules grow in a bulk-like structure with their long axes orientated upright to the substrate surface.

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Correspondence to Ch. Wöll.

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Hänel, K., Söhnchen, S., Lukas, S. et al. Organic molecular-beam deposition of perylene on Cu(110): Results from near-edge x-ray absorption spectroscopy, x-ray photoelectron spectroscopy, and atomic force microscopy. Journal of Materials Research 19, 2049–2056 (2004). https://doi.org/10.1557/JMR.2004.0256

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