Solid-state amorphization in Al–Pt thin films

Journal of Materials Research volume 3, pages884–889(1988)Cite this article

Abstract

Solid-state amorphization is reported to occur in aluminum-platinum thin films. A uniform amorphous alloy layer was observed at the interface between aluminum and platinum layers for electron beam evaporated samples in an as-deposited state. For a pure aluminum overlayer deposited on top of a coevaporated Al–Pt amorphous alloy, the aluminum dissolves into the amorphous phase leading to a fully amorphous sample. In this last case the amorphization is nonuniform upon low-temperature anneals (T < ≃2 200 °C) and gives rise to hole formation in the aluminum overlayer. Direct observations of this phenomenon during in situ annealing of the thin films in a transmission electron microscope were carried out.

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Affiliations

  1. Department of Materials Science and Engineering, Cornell University, Ithaca, 14853, New York, USA

    J. M. Legresy, B. Blanpain & J. W. Mayer

Authors
  1. J. M. Legresy
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  2. B. Blanpain
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  3. J. W. Mayer
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Correspondence to J. M. Legresy.

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Legresy, J.M., Blanpain, B. & Mayer, J.W. Solid-state amorphization in Al–Pt thin films. Journal of Materials Research 3, 884–889 (1988). https://doi.org/10.1557/JMR.1988.0884

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