Surface characterization methods— XPS,TOF-SIMS, and SAM a complimentary ensemble of tools

  • J. E. deVries
Article

Abstract

X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (TOF-SIMS), and scanning auger microscopy (SAM) analytical techniques have played important roles in the characterization of the surface and the interfacial chemistry governing properties and performance of materials, and material interfaces. These techniques afford spatially resolved elemental and molecular analysis of the topmost atomic layers of solid surfaces and interfaces. Currently available instrumentation provides qualitative/quantitative analysis on molecularly complex materials with detection limits in the parts-per-billion (ppb) range and spatial resolutions approaching 30 nm. Each technique is unique in the information attained, therefore necessitating a multitechnique approach to achieve a complete surface characterization. Examples of coating/interfacial characterization by XPS, TOF-SIMS, and SAM are presented illustrating the functionality of these tools and the complimentary natures of them.

Keywords

coating characterization failure analysis 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    T.A. Carlson,Photoelectron and Auger Spectroscopy, Plenum Press, 1975Google Scholar
  2. 2.
    A.W. Czanderna,Methods of Surface Analysis, Elsevier, 1975Google Scholar
  3. 3.
    A. Benninghoven, F.G. Rüdenauer, and H.W. Werner,Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects,Applications, and Trends, John Wiley & Sons, Inc., 1987Google Scholar
  4. 4.
    M. Neay, P. Wilson, and G. Skerl,J. Coatings Technol, Vol 66 (No. 832), 1994, p 27Google Scholar
  5. 5.
    L.E. Davis, N.C. MacDonald, P.W. Palmberg, G.E. Reich, and R.E. Weber,Handbook of Auger Electron Spectroscopy, Physical Electronics Industries, Inc., 1978Google Scholar
  6. 6.
    D.R. Bauer, M.C. Paputa Peck, and R.O. Carter,J. Coatings Technol, Vol 59, 1987, p 103Google Scholar
  7. 7.
    J.L. Gerlock, T.J. Prater, S.L. Kaberline, and J.E. deVries,Polym. Degradation Stab., Vol 47, 1995, p 405CrossRefGoogle Scholar

Copyright information

© ASM International 1998

Authors and Affiliations

  • J. E. deVries
    • 1
  1. 1.Ford Motor CompanyScientific Research LaboratoryDearborn

Personalised recommendations