Advertisement

On universality of scaling law describing roughness of triple line

  • Edward Bormashenko
  • Albina Musin
  • Gene Whyman
  • Zahava Barkay
  • Michael Zinigrad
Regular Article

Abstract.

The fine structure of the three-phase (triple) line was studied for different liquids, various topographies of micro-rough substrates and various wetting regimes. Wetting of porous and pillar-based micro-scaled polymer surfaces was investigated. The triple line was visualized with the environmental scanning electron microscope and scanning electron microscope for the “frozen” triple lines. The value of the roughness exponent \(\zeta\) for water (ice)/rough polymer systems was located within 0.55-0.63. For epoxy glue/rough polymer systems somewhat lower values of the exponent, \( 0.42 < \zeta < 0.54\), were established. The obtained values of \(\zeta\) were close for the Cassie and Wenzel wetting regimes, different liquids, and different substrates’ topographies. Thus, the above values of the exponent are to a great extent universal. The switch of the exponent, when the roughness size approaches to the correlation length of the defects, is also universal.

Graphical abstract

Keywords

Soft Matter: Polymers and Polyelectrolytes 

References

  1. 1.
    P.G. de Gennes, Rev. Mod. Phys. 57, 827 (1985)CrossRefADSGoogle Scholar
  2. 2.
    J.F. Joanny, P.G. de Gennes, J. Chem. Phys. 81, 552 (1984)CrossRefADSGoogle Scholar
  3. 3.
    M.A. Rubio, C.A. Edwards, A. Dougherty, J.P. Gollub, Phys. Rev. Lett. 63, 1685 (1990)CrossRefADSGoogle Scholar
  4. 4.
    V.K. Horvath, F. Family, T. Vicsek, J. Phys. A 24, L25 (1991)CrossRefADSGoogle Scholar
  5. 5.
    S.V. Buldyrev, A.-L. Barabasi, Phys. Rev. A 45, R8313 (1992)CrossRefADSGoogle Scholar
  6. 6.
    M. Plischke, Z. Racz, R.K.P. Zia, Phys. Rev. E 50, R3589 (1994)CrossRefADSGoogle Scholar
  7. 7.
    W.M. Tong, R.S. Williams, A. Yanase, Y. Segawa, M.S. Anderson, Phys. Rev. Lett. 72, 3374 (1994)CrossRefADSGoogle Scholar
  8. 8.
    M.E.R. Shanahan, Adv. Colloid Interface Sci. 39, 35 (1992)CrossRefGoogle Scholar
  9. 9.
    P.G. de Gennes, F. Brochard-Wyart, D. Quéré, Capillarity and Wetting Phenomena (Springer, Berlin, 2003)Google Scholar
  10. 10.
    T. Vicsek, F. Family, Phys. Rev. Lett. 52, 1670 (1984)CrossRefADSGoogle Scholar
  11. 11.
    F. Family, T. Vicsek, J. Phys. A 18, L75 (1985)CrossRefADSGoogle Scholar
  12. 12.
    E.L. Decker, S. Garoff, Langmuir 13, 6321 (1997)CrossRefGoogle Scholar
  13. 13.
    E. Rolley, C. Guthmann, R. Gombrowicz, V. Repain, Phys. Rev. Lett. 80, 2865 (1998)CrossRefADSGoogle Scholar
  14. 14.
    S. Moulinet, Al. Rosso, W. Krauth, E. Rolley, Phys. Rev. E 69, R035103 (2004)CrossRefADSGoogle Scholar
  15. 15.
    S. Moulinet, C. Guthmann, E. Rolley, Eur. Phys. J. E 8, 437 (2002)CrossRefGoogle Scholar
  16. 16.
    A. Rosso, W. Krauth, Phys. Rev. Lett. 87, 187002-1 (2001)CrossRefADSGoogle Scholar
  17. 17.
    M.O. Robbins, J.F. Joanny, Europhys. Lett. 3, 729 (1987)CrossRefADSGoogle Scholar
  18. 18.
    D. Iliev, N. Pesheva, S. Iliev, Langmuir 29, 5781 (2013)CrossRefGoogle Scholar
  19. 19.
    A. Prevost, E. Rolley, C. Guthmann, Phys. Rev. B 65, 064517 (2002)CrossRefADSGoogle Scholar
  20. 20.
    M. Kardar, Phys. Reports 301, 85 (1998)CrossRefADSGoogle Scholar
  21. 21.
    S. Santucci, M. Grob, R. Toussaint, J. Schmittbuhl, A. Hansen, K.J. Mal\'øy, EPL 92, 44001 (2010)CrossRefADSGoogle Scholar
  22. 22.
    A. Delaplace, J. Schmittbuhl, K.J. Mal\'øy, Phys. Rev. E 60, 1337 (1999)CrossRefADSGoogle Scholar
  23. 23.
    W.-P. Cao, M.-B. Luo, Physica C 493, 45 (2013)CrossRefADSGoogle Scholar
  24. 24.
    R. Golestanian, Philos. Trans. R. Soc. London A 362, 1613 (2004)CrossRefMATHMathSciNetADSGoogle Scholar
  25. 25.
    E. Bormashenko, A. Musin, G. Whyman, Z. Barkay, M. Zinigrad, Langmuir 29, 14163 (2013)CrossRefGoogle Scholar
  26. 26.
    A. Leh, H.E. N'guessan, J. Fan, Pr. Bahadur, R. Tadmor, Y. Zhao, Langmuir 28, 5795 (2012)CrossRefGoogle Scholar
  27. 27.
    G. Widawski, M. Rawiso, B. François, Nature 369, 387 (1994)CrossRefADSGoogle Scholar
  28. 28.
    E. Bormashenko, R. Pogreb, O. Stanevsky, Ye. Bormashenko, T. Stein, V.-Z. Gaisin, R. Cohen, O. Gengelman, Macromol. Mater. Eng. 290, 114 (2005)CrossRefGoogle Scholar
  29. 29.
    A. Muñoz-Bonilla, M. Fernández-García, J. Rodríguez-Hernández, Progr. Polym. Sci. 39, 510 (2014)CrossRefGoogle Scholar
  30. 30.
    Y. Xia, G.M. Whitesides, Annu. Rev. Mater. Sci. 28, 153 (1998)CrossRefADSGoogle Scholar
  31. 31.
    R. Dufour, P. Brunet, M. Harnois, R. Boukherroub, V. Thomy, V. Senez, Small 8, 1229 (2012)CrossRefGoogle Scholar
  32. 32.
    L. Feng, Y. Zhang, J. Xi, Y. Zhu, N. Wang, F. Xia, L. Jiang, Langmuir 24, 4114 (2008)CrossRefGoogle Scholar
  33. 33.
    E. Bormashenko, T. Stein, R. Pogreb, D. Aurbach, J. Phys. Chem. C 113, 5568 (2009)CrossRefGoogle Scholar
  34. 34.
    B. Bhushan, M. Nosonovsky, Philos. Trans. R. Soc. A 368, 4713 (2010)CrossRefMATHMathSciNetADSGoogle Scholar
  35. 35.
    E. Bormashenko, Y. Bormashenko, G. Whyman, R. Pogreb, O. Stanevsky, J. Colloid Interface Sci. 302, 308 (2006)CrossRefGoogle Scholar
  36. 36.
    E. Bormashenko, R. Pogreb, G. Whyman, S. Balter, D. Aurbach, J. Adhes. Sci. Technol. 26, 1169 (2012)Google Scholar
  37. 37.
    A.B.D. Cassie, S. Baxter, Trans. Faraday Soc. 40, 546 (1944)CrossRefGoogle Scholar
  38. 38.
    A.B.D. Cassie, Discuss. Faraday Soc. 3, 11 (1948)CrossRefGoogle Scholar
  39. 39.
    A. Lafuma, D. Quéré, Nat. Mater. 2, 457 (2003)CrossRefADSGoogle Scholar
  40. 40.
    R.N. Wenzel, Ind. Eng. Chem. 28, 988 (1936)CrossRefGoogle Scholar
  41. 41.
    R.J. Good, J. Am. Chem. Soc. 74, 5041 (1952)CrossRefGoogle Scholar
  42. 42.
    H.Y. Erbil, Solid and Liquid Interfaces (Blackwell Publishing, Oxford, 2006)Google Scholar
  43. 43.
    E. Bormashenko, Wetting of Real Surfaces (De Gruyter, Berlin, 2013)Google Scholar
  44. 44.
    P. Chauve, P. Le Doussal, K. Wiese, Phys. Rev. Lett. 86, 1785 (2001)CrossRefADSGoogle Scholar
  45. 45.
    A. Be'er, Y. Lereah, H. Taitelbaum, Physica A 285, 156 (2000)CrossRefADSGoogle Scholar
  46. 46.
    A. Be'er, I. Hecht, H. Taitelbaum, Phys. Rev. E 72, 031606 (2005)CrossRefADSGoogle Scholar

Copyright information

© EDP Sciences, SIF, Springer-Verlag Berlin Heidelberg 2015

Authors and Affiliations

  • Edward Bormashenko
    • 1
    • 2
  • Albina Musin
    • 1
    • 2
  • Gene Whyman
    • 1
  • Zahava Barkay
    • 3
  • Michael Zinigrad
    • 2
  1. 1.Department of PhysicsAriel UniversityArielIsrael
  2. 2.Department of Chemical Engineering and BiotechnologyAriel UniversityArielIsrael
  3. 3.Wolfson Applied Materials Research CenterTel Aviv UniversityRamat-AvivIsrael

Personalised recommendations