Abstract.
The surface topography of thin diblock copolymer films is studied by atomic force microscopy (AFM). With AFM an island-to-ribbon transition is observed for symmetric polystyrene-b-poly (4-vinylpyridine) (PS-b-P4VP) on mica with increasing solution concentration. Our study also demonstrates how the formation of the pattern strongly depends on the copolymer composition based on the volume fraction. The substrate and solvent used both have great effects on the morphology of the thin films. Only by using highly polar substrate (mica), can we gain regular pattern. The reason why the regular islands cannot be obtained with symmetric PS-b-P4VP on graphite is also explained. On mica using nonselective and selective solvents, a rather regular pattern can be obtained. The difference is only in the solution concentration for forming regular patterns.
Similar content being viewed by others
References
G.J. Kallogg, D.G. Walton, A.M. Mayes, P. Lambooy, T.P. Rassel, P.D. Callagher, S.K. Satija, Phys. Rev. Lett. 76, 2503 (1996)
T.L. Morkved, M. Lu, A.M. Urbas, E.E. Ehrichs, H.M. Jaeger, P. Mansky, T.P. Russell, Science 273, 931 (1996)
D.G. Walton, G.J. Kellogg, A.M. Mayes, P. Lambooy, T.P. Russell, Macromolecules 27, 6225 (1994)
C.S. Henkee, E.L. Thomas, L.J. Fetters, J. Mater. Sci. 23, 1685 (1988)
T.L. Morkved, H.M. Jaeger, Europhys. Lett. 40, 643 (1997)
R. Singhvi, A. Kumar, G.P. Lopez, G.N. Stephanopoulos, D.I.C. Wang, G.M. Whitesides, D.E. Ingber, Science 264, 696 (1994)
J.P. Spatz, S. Sheiko, M. Moller, Adv. Mater. 8, 513 (1996)
J.P. Spatz, M. Moller, M. Noeske, R.J. Behm, M. Pietralla, Macromolecules 30, 3874 (1997)
J.C. Meiners, A. Quintel-Ritzi, J. Mlynek, H. Elbs, G. Krausch, Macromolecules 30, 4945 (1997)
J.P. Spatz, A. Roescher, M. Moller, Adv. Mater. 8, 337 (1996)
J.P. Spatz, P. Eibeck, S. Mossmer, M. Moller, T. Herzog, P. Ziemann, Adv. Mater. 10, 849 (1998)
K. Fukunaga, H. Elbs, G. Krausch, Langmuir 16, 3774 (2000)
F.S. Bates, G.H. Fredrickson, Ann. Rev. Mater. Sci. 41, 425 (1990)
G. Krausch, Mater. Sci. Eng. R 14, 1 (1995)
J. Zhu, A. Eisenberg, R.B. Lennox, Macromolecules 25, 6547 (1992); J. Zhu, A. Eisenberg, R.B. Lennox, Macromolecules 25, 6556 (1992); J. Zhu, A. Eisenberg, R.B. Lennox, Langmuir 7, 1579 (1991)
Z. Li, W. Zhao, M.H. Rafailovich, J. Sokolov, K. Khougaz, B. Lennox, A. Eisenberg, G. Krausch, J. Am. Chem. Soc. 118, 10892 (1996)
J.P. Spatz, P. Eibeck, S. Mössmer, M. Möller, E.Y. Kramarenko, P.G. Khalatur, I.I. Potemkin, A.R. Khokhlov, R.G. Winkler, P. Reineker, Macromolecules 33, 150 (2000)
E.Y. Kramarenko, I.I. Potemkin, A.R. Khokhlov, R.G. Winkler, P. Reineker, Macromolecules 32, 3495 (1999)
I.I. Potemkin, E.Y. Kramarenko, A.R. Khokhlov, R.G. Winkler, P. Reineker, P. Eibeck, J.P. Spatz, M. Moller, Langmuir 15, 7290 (1999)
S. Zheng, W. Zhao, M.H. Rafailovich, J. Sokolov, S.A. Schwarz, R.B. Lennox, A. Eisenberg, Bull. Am. Phys. Soc. 39, 418 (1994)
S.S. Sheiko, Adv. Polym. Sci. 151, 61 (2000)
S.N. Magonov, N.A. Yerina, Languir 19, 500 (2003)
S.I. Park, C.F. Quate, Appl. Phys. Lett. 48, 112 (1986)
R.D. Peters, X.M. Yang, T.K. Kim, B.H. Sohn, P.F. Nealey, Langmuir 16, 4625 (2000)
B.H. Sohn, B.H. Seo, Chem. Mater. 13, 1752 (2001)
Y. Funaki, K. Kumano, T. Nakao, H. Jinnai, H. Yoshida, K. Kimishima, T. Tsutsumi, Y. Hirokawa, T. Hashimoto, Polymer 40, 7147 (1999)
([SEE TEXT]) Polymer Handbook, 4th edn, edited by J. Brandrup, E.H. Immergut, E.A. Grulke (New York, Wiley, 1999) (2) S.W. Kuo, C.L. Lin, F.C. Chang, Polymer 43, 3943 (2002)
N.D. Denkov, O.D. Velev, P.A. Kralchevsky, I.B. Ivanov, H. Yoshimura, K. Nagayama, Langmuir 8, 3183 (1992)
J.P. Spatz, S. Sheiko, M. Moller, Macromolecules 29, 3220 (1996)
J.C. Meiners, A. Ritzi, M.H. Rafailovich, J. Sokolov, J. Mlynek, G. Krausch, Appl. Phys. A 61, 519 (1995)
J.C. Meiners, H. Elbs, A. Ritzi, J. Mlynek, G. Krausch, J. Appl. Phys. 80, 2224 (1996)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Zhao, J., Tian, S., Wang, Q. et al. Nanoscopic surface patterns of diblock copolymer thin films. Eur. Phys. J. E 16, 49–56 (2005). https://doi.org/10.1140/epje/e2005-00006-1
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1140/epje/e2005-00006-1