Abstract.
Silver clusters have been produced by magnetron sputtering in a gas aggregation nanocluster source. Clusters are size selected using a quadrupole mass filter (3–8 nm) or by varying the aggregation tube length (9–20 nm) of the nanocluster source. Mass selected clusters are deposited on a Si(100) substrate at different bias voltages and are characterized by atomic force microscopy. We observe a significant flattening of clusters on the surface due to the increase of impact energy as a result of increasing substrate bias voltage. The behavior of lattice parameters for size selected clusters are investigated by X-ray diffraction. All measured lattice constants exhibit a tensile strain; it is found that the lattice constant slightly increases with increasing cluster size up to a size of 12 nm and then decreases. The melting temperature of deposited clusters is found to be size-dependent and significantly lower than for bulk material, in agreement with theoretical considerations.
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Shyjumon, I., Gopinadhan, M., Ivanova, O. et al. Structural deformation, melting point and lattice parameter studies of size selected silver clusters. Eur. Phys. J. D 37, 409–415 (2006). https://doi.org/10.1140/epjd/e2005-00319-x
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DOI: https://doi.org/10.1140/epjd/e2005-00319-x