Abstract
We study the transient statistical properties of short and long Josephson junctions under the influence of thermal and correlated fluctuations. In particular, we investigate the lifetime of the superconductive metastable state finding the presence of noise induced phenomena. For short Josephson junctions we investigate the lifetime as a function both of the frequency of the current driving signal and the noise intensity and we find how these noise-induced effects are modified by the presence of a correlated noise source. For long Josephson junctions we integrate numerically the sine-Gordon equation calculating the lifetime as a function of the length of the junction both for inhomogeneous and homogeneous bias current distributions. We obtain a non-monotonic behavior of the lifetime as a function of the frequency of the current driving signal and the correlation time of the noise. Moreover we find two maxima in the non-monotonic behaviour of the mean escape time as a function of the correlated noise intensity.
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References
G. Wendin, V.S. Shumeiko, Low Temp. Phys. 33, 724 (2007)
J.H. Kim, R.P. Dhungana, K.S. Park, Phys. Rev. B 73, 214506 (2006)
A.B. Zorin et al., Phys. Rev. B 74, 014508 (2006)
A.J. Berkley et al., Phys. Rev. B 68, 060502(R) (2003)
C.H. Wu et al., Nanotechnology 19, 315304 (2008)
Y. Nakamura et al., Nature 398, 786 (1999)
J.R. Friedman et al., Nature 406, 43 (2000)
J.M. Martinis et al., Phys. Rev. Lett. 89, 117901 (2002)
L. Hao, J.C. Macfarlane, Physica C 292, 315 (1997)
H. Xu et al., Phys. Rev. B 71, 064512 (2005)
A. Marx et al., Phys. Rev. B 51, 6735 (1995)
C.M. Falco et al., Phys. Rev. B 10, 1865 (1974)
J.T. Peltonen, A.V. Timofeev, M. Meschke, J.P. Pekola, J. Low Temp. Phys. 146, 135 (2006)
Y. Yu et al., Science 296, 889 (2002)
Y. Yu, S. Han, Phys. Rev. Lett. 91, 127003 (2003)
G. Sun et al., Phys. Rev. E 75, 021107 (2007)
D. Gulevich, F. Kusmartsev, Physica C 435, 87 (2006)
C.R. Doering, J.C. Gadoua, Phys. Rev. Lett. 69, 2318 (1992); R.N. Mantegna, B. Spagnolo, Phys. Rev. Lett. 84, 3025 (2000)
A.A. Dubkov, N.V. Agudov, B. Spagnolo, Phys. Rev. E 69, 061103(7) (2004)
A.L. Pankratov, B. Spagnolo, Phys. Rev. Lett. 93, 177001(4) (2004)
R.N. Mantegna, B. Spagnolo, Phys. Rev. Lett. 76, 563 (1996); N. Agudov, B. Spagnolo, Phys. Rev. Rap. Comm. E 64, 035102(R) (2001)
B. Spagnolo, A.A. Dubkov, N.V. Agudov, Acta Physica Polonica B 35, 1419 (2004); A.A. Dubkov, N.V. Agudov, B. Spagnolo, Phys. Rev. E 69, 061103(7) (2004); A. Fiasconaro, B. Spagnolo, S. Boccaletti, Phys. Rev. E 72, 061110(5) (2005); B. Spagnolo et al., Acta Physica Polonica B 38, 1925 (2007)
R.F. Voss, R.A. Webb, Phys. Rev. Lett. 47, 265 (1981)
M. Büttiker, E.P. Harris, R. Landauer, Phys. Rev. B 28, 1268 (1983)
H. Kashiwaya, T. Matsumoto, H. Shibata, S. Kashiwaya, H. Eisaki, Y. Yoshida, S. Kawabata, Y. Tanaka, J. Phys. Soc. Jpn 77, 104708 (2008)
A. Barone, G. Paternò, Physics and Application of the Josephson Effect (Wiley, New York, 1982), p. 122
A.V. Gordeeva, A.L. Pankratov, B. Spagnolo, Int. J. Bif. Chaos 18, 2823 (2008)
C.W. Gardiner, Handbook of Stochastic Methods (Springler-Verlag, Berlin, 2004), p. 106
D.R. Gulevich et al., Phys. Rev. Lett. 101, 127002 (2008); C. Cattuto, F. Marchesoni, Phys. Rev. Lett. 79, 5070 (1997)
K.G. Fedorov, A.L. Pankratov, Phys. Rev. B 76, 024504 (2007)
K.G. Fedorov, A.L. Pankratov, B. Spagnolo, Int. J. Bif. Chaos 18, 2855 (2008)
P.S. Lomdahl, O.H. Soerensen, P.L. Christiansen, Phys. Rev. B 25, 5737 (1982)
Y. Zhang, Theoretical and experimental studies of the flux-flow type Josephson oscillator, Ph.D. thesis, Chalmers University of Technology, 1991, p. 57
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Augello, G., Valenti, D., Pankratov, A. et al. Lifetime of the superconductive state in short and long Josephson junctions. Eur. Phys. J. B 70, 145–151 (2009). https://doi.org/10.1140/epjb/e2009-00155-x
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DOI: https://doi.org/10.1140/epjb/e2009-00155-x