Abstract
The formation of silicon–nitrogen nanolayers on the GaAs surface with orientations (100) and (110) by molecular layering in the temperature range of 423–773 K without activation and with activation of the process by a glow discharge at the stage of the ammonia supply is studied. The conditions for the growth of silicon nitride nanostructures and the layer mechanism of their formation are determined.
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REFERENCES
Ahvenniemi, E., Akbashev, A.R., Ali, S., et al., Review article: Recommended reading list of early publications on atomic layer deposition—Outcome of the “Virtual project on the history of ALD,” J. Vac. Sci. Technol., A, 2017, vol. 35, no. 1, art. ID 010801.
Ezhovskii, Yu.K. and Kholkin, V.Yu., Growth and properties of Al2O3 and SiO2 nanolayers on III–V semiconductors, Inorg. Mater., 2010, vol. 46, no. 1, pp. 38–42.
Kääriäinen, T., Cameron, D., Kääriäinen, M.-L., and Sherman, A., Atomic Layer Deposition: Principles, Characteristics, and Nanotechnology Applications, Hoboken, NJ: Wiley, 2013, 2nd ed.
Gaskins, J.T., Hopkins, P.E., Merrill, D.R., et al., Review—investigation and review of the thermal, mechanical, electrical, optical, and structural properties of atomic layer deposited high-k dielectrics: beryllium oxide, aluminum oxide, hafnium oxide, and aluminum nitride, ECS J. Solid State Sci. Technol., 2017, vol. 6, no. 10, pp. N189– N208.
Gougousi, T., Atomic layer deposition of high-k dielectrics on III–V semiconductor surfaces, Prog. Cryst. Growth Charact. Mater., 2016, vol. 62, no. 4, pp. 1–21.
Ezhovskii, Yu.K., Molecular layering of silicon nitride nanolayers, Zh. Fiz. Khim., 2017, vol. 91, no. 7, pp. 1207–1210.
Gromov, V.K., Vvedenie v ellipsometriyu (Introduction to Ellipsometry), Leningrad: Leningr. Gos. Univ., 1986.
Nefedov, V.I. and Cherepin, V.T., Fizicheskie metody issledovnaiya poverkhnosti tverdykh tel (Physical Methods of Studying Solid Surfaces), Moscow: Nauka, 1983.
Nefedov, V.I., Rentgeno-elektronnaya spektroskopiya khimicheskikh soedninenii (X-Ray Electron Spectroscopy of Chemical Compounds), Moscow: Khimiya, 1984.
Ezhovskii, Yu.K., Reactivity of solid surfaces in the chemical nanotechnology of low-dimensional systems, J. Surf. Invest.: X-Ray, Synchrotron Neutron Tech., 2015, vol. 9, no. 3, pp. 462–467.
Unuma, H., Yamamoto, M., Suzuki, Y., and Sakka, S., Ammonolysis of silica gels containing methyl groups, J. Non-Cryst. Solids, 1991, vol. 128, no. 3, pp. 223–230.
Rubtsova, E.A. and Eremin, E.N., Heterogeneous catalytic effects in ammonia reactions in electrical discharges. I. Glow discharge, Zh. Fiz. Khim., 1968, vol. 42, no. 4, pp. 1022– 1026.
Rubtsova, E.A. and Eremin, E.N., Heterogeneous catalytic effects in ammonia reactions in electrical discharges. III. Barrier discharge, Zh. Fiz. Khim., 1971, vol. 45, no. 6, pp. 1499–1503.
Yi, Y., Zhang, R., Wang, L., Yan, J., et al., Plasma-triggered CH4/NH3 coupling reaction for direct synthesis of liquid nitrogen-containing organic chemicals, 2017, vol. 2, no. 12, pp. 9199–9210
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Ezhovskii, Y.K., Mikhailovskii, S.V. Molecular Layering of Silicon Nitride Nanolayers with the Use of Ammonia Plasma. Inorg. Mater. Appl. Res. 12, 181–185 (2021). https://doi.org/10.1134/S2075113321010081
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DOI: https://doi.org/10.1134/S2075113321010081