Synthesis and studies of local of ferroelectric properties of lead zirconate titanate thin films obtained by sol-gel technique
Morphology of the surface and local ferroelectric properties of thin lead zirconate titanate (PZT) films synthesized by the sol-gel technique are studied by scanning probe microscopy. It is shown that the surface of the films has quite low roughness of ∼2 nm and small average grain size of 20 nm. It is found that the film is polarized under impact of a positive or negative potential applied to the “probe-sample” system. The relaxation times of signals of residual ferroelectric responses are measured, and the rate of the lateral movement of the domain wall for PZT film is calculated.
KeywordsPZT thin films sol-gel method ferroelectricity domain wall scanning probe microscopy
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