Abstract
Conditions for the synthesis of dispersion titanium dioxide with a developed roughness by molecular layering on the silicon surface were determined and structural characteristics of the resulting layer were studied. Electroactive surface area of the titanium dioxide nano-roughened films obtained by the proposed method is higher than those of the reference (smooth) titanium oxide film and the reference silicon electrode by factors 1.1 and 1.2, respectively.
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Original Russian Text © V.S. Mironov, E.G. Zemtsova, V.M. Smirnov, 2018, published in Zhurnal Obshchei Khimii, 2018, Vol. 88, No. 3, pp. 524–526.
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Mironov, V.S., Zemtsova, E.G. & Smirnov, V.M. Molecular Layering Synthesis of TiO2 Nanolayer with Developed Roughness on Silicon as a Promising Basis for Biosensors. Russ J Gen Chem 88, 613–615 (2018). https://doi.org/10.1134/S1070363218030386
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DOI: https://doi.org/10.1134/S1070363218030386