Precise Magnetometric Diagnostics of Critical-Current Inhomogeneities in High-Temperature Semiconductor Tapes
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We present a new precise method of contactless magnetometric determination of the local critical current in high-temperature superconductor (HTS) tapes, which involves (i) measurement of the spatial distribution of a magnetic field of currents induced due to magnetization of the tape by an array of permanent magnets and (ii) processing of the obtained results using a modified algorithm of solution of the Biot–Savart–Laplace inverse problem. The use of an array of permanent magnets is an important feature that distinguishes the proposed method from other existing techniques, since it allows the spatial distribution of critical current to be thoroughly analyzed over the entire tape area.
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