Technical Physics Letters

, Volume 43, Issue 12, pp 1136–1139 | Cite as

Precise Magnetometric Diagnostics of Critical-Current Inhomogeneities in High-Temperature Semiconductor Tapes

  • A. I. Podlivaev
  • S. V. Pokrovskii
  • I. V. Anischenko
  • I. A. Rudnev


We present a new precise method of contactless magnetometric determination of the local critical current in high-temperature superconductor (HTS) tapes, which involves (i) measurement of the spatial distribution of a magnetic field of currents induced due to magnetization of the tape by an array of permanent magnets and (ii) processing of the obtained results using a modified algorithm of solution of the Biot–Savart–Laplace inverse problem. The use of an array of permanent magnets is an important feature that distinguishes the proposed method from other existing techniques, since it allows the spatial distribution of critical current to be thoroughly analyzed over the entire tape area.


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Copyright information

© Pleiades Publishing, Ltd. 2017

Authors and Affiliations

  • A. I. Podlivaev
    • 1
  • S. V. Pokrovskii
    • 1
  • I. V. Anischenko
    • 1
  • I. A. Rudnev
    • 1
  1. 1.National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)MoscowRussia

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