Abstract
In this work we have studied volt-ampere characteristics of single core-shell GaN/InGaN/GaN nanowire. It was experimentally shown that negative differential resistance effect can be obtained in the studied heterostructure. On the base of numerical calculation results the model describing negative differential resistance phenomenon was proposed. We assume this effect to be related with strong localization of current flow inside the nanowire and emergence of Gunn effect in this area.
Similar content being viewed by others
References
V. Gružinskis et al., Mater. Sci. Forum 297–298, 341 (1999).
H. Eisele et al., IEEE Trans. Microwave Theory Technol. 48, 626 (2000).
A. A. Vasiliev et al., J. Phys.: Conf. Ser. 741, 012007 (2016).
R. K. Crouch et al., Science 13, 2358 (1978).
S. Adachi, Properties of Semiconductor Alloys—Group-IV, III–V and II–VI Semiconductors (Wiley, Chichester, 2009)
J. J. Barnes et al., IEEE Trans. Electron Dev. 23, 1042 (1976).
Author information
Authors and Affiliations
Corresponding author
Additional information
The article is published in the original.
Rights and permissions
About this article
Cite this article
Mozharov, A.M., Vasiliev, A.A., Bolshakov, A.D. et al. Core-Shell III-Nitride Nanowire Heterostructure: Negative Differential Resistance and Device Application Potential. Semiconductors 52, 489–492 (2018). https://doi.org/10.1134/S1063782618040231
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063782618040231