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X-Ray Topography: Yesterday, Today, and Prospects for the Future

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Abstract

X-ray topography is a set of X-ray diffraction techniques that make it possible to see images of defects, to determine their type and location in the volume of the crystal structure or on its surface, and to measure their main characteristics. The review discusses the possibilities, limitations, and prospects of X-ray topography methods.

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  1. Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow oblast, 142432, Russia

    E. V. Suvorov

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Original Russian Text © E.V. Suvorov, 2018, published in Poverkhnost’, 2018, No. 9, pp. 3–22.

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Suvorov, E.V. X-Ray Topography: Yesterday, Today, and Prospects for the Future. J. Surf. Investig. 12, 835–852 (2018). https://doi.org/10.1134/S1027451018050026

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