Investigations of the Growth Processes of Bismuth-Germanate Crystals (Bi12GeO20) from the Melt using the X-Ray Diffraction Characteristics of Natural Lateral Faces

  • A. A. Mololkin
  • A. I. Protsenko
  • A. E. Blagov
  • A. V. Vinogradov
  • V. A. Lomonov
  • Yu. V. Pisarevskii
  • A. V. Targonskii
  • Ya. A. Eliovich
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Abstract

Single crystals of bismuth-germanate grown by the Czochralski method and possessing a combination of piezoelectric, electro-optical and magneto-optical characteristics are studied. The possibility of the non-destructive quality control of the grown crystals by X-ray diffraction investigation of their natural lateral faces is shown.

Keywords

crystal growth bismuth germanate Czochralski method X-ray diffraction methods rocking curve 
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Copyright information

© Pleiades Publishing, Ltd. 2018

Authors and Affiliations

  • A. A. Mololkin
    • 1
    • 2
  • A. I. Protsenko
    • 2
    • 3
  • A. E. Blagov
    • 2
    • 3
  • A. V. Vinogradov
    • 2
  • V. A. Lomonov
    • 2
  • Yu. V. Pisarevskii
    • 2
    • 3
  • A. V. Targonskii
    • 2
    • 3
  • Ya. A. Eliovich
    • 2
    • 3
  1. 1.National University of Science and Technology (MISiS)MoscowRussia
  2. 2.Shubnikov Institute of Crystallography, Scientific-Research Center “Crystallography and Photonics,”Russian Academy of SciencesMoscowRussia
  3. 3.National Research Center “Kurchatov Institute,”MoscowRussia

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