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Investigations of the Growth Processes of Bismuth-Germanate Crystals (Bi12GeO20) from the Melt using the X-Ray Diffraction Characteristics of Natural Lateral Faces

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Abstract

Single crystals of bismuth-germanate grown by the Czochralski method and possessing a combination of piezoelectric, electro-optical and magneto-optical characteristics are studied. The possibility of the non-destructive quality control of the grown crystals by X-ray diffraction investigation of their natural lateral faces is shown.

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Correspondence to A. A. Mololkin.

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Original Russian Text © A.A. Mololkin, A.I. Protsenko, A.E. Blagov, A.V. Vinogradov, V.A. Lomonov, Yu.V. Pisarevskii, A.V. Targonskii, Ya.A. Eliovich, 2018, published in Poverkhnost’, 2018, No. 1, pp. 81–86.

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Mololkin, A.A., Protsenko, A.I., Blagov, A.E. et al. Investigations of the Growth Processes of Bismuth-Germanate Crystals (Bi12GeO20) from the Melt using the X-Ray Diffraction Characteristics of Natural Lateral Faces. J. Surf. Investig. 12, 69–74 (2018). https://doi.org/10.1134/S1027451018010159

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  • DOI: https://doi.org/10.1134/S1027451018010159

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