Abstract
In this paper we study modeling techniques for functional failures in digital systems under the radiation effect; these techniques are based on Brouwer’s model of a fuzzy digital automaton. In comparison with common approaches, a fundamental difference of such method lies in the feasibility of explicit consideration (in functional-logical models) of the relationship between radiation resistance of integrated circuits (IC) and their mode of operation, functional state, engineering and schematic parameters. In addition, certain methods for constructing criterion membership functions are proposed for basic elements in different IC. Finally, the algorithms for forecasting transient and residual radiation effects in IC are developed.
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Pronin, E.G. and Morgueva, O.V., Proektirovanie bortovykh sistem obmena informatsii (The Design of On-board Data Exchange Systems), Moscow: Radio i Svyaz’, 1989.
Beichelt, F. and Franken, P., Zuverlässigkeit und Instandhaltung, Leipzig: Hanser, 1984. Translated under the title Nadezhnost’ i tekhnicheskoe obespechenie. Matematicheskii podkhod, Moscow: Radio i Svyaz’, 1988.
Gorshkov, V.N., Nadezhnost’ operativnykh zapominayushchikh ustroistv EVM (Reliability of Randomaccess Memory of Computers), Leningrad: Energoatomizdat, 1987.
Astvatsatur’yan, E.R. and Belyaev, V.A., Forecasting Functional “Slot-type” Resiadual Effects in Elements of TTL LSI, in Elektronika i avtomatizatsiya v nauchnykh issledovaniyakh (Electronics and Automation in Scientific Research), Rybin, V.M., Ed., Moscow: Energoatomizdat, 1988, pp. 87–89.
Shirshev, L.G., Ioniziruyushchie izlucheniya i elektronika (Ionizing Radiation and Electronics), Moscow: Sovetskoe Radio, 1969.
Bubennikov, A.N., Mityashev, B.N., and Sadovnikov, A.D., Multilevel Modeling and Optimization of High-speed Bipolar IC and LSI, Radiotekh., 1985, no. 1, pp. 26–31.
Glushkov, V.M., Sintez tsifrovykh avtomatov (Synthesis of Digital Automata), Moscow: Fizmatlit, 1962.
Astvatsatur’yan, E.R., The Principles of Hierarchical Approach to Analyze Radiation Effects in IC and Related Devices, in Voprosy sozdaniya radiatsionno-stoikikh poluprovodnikovykh priborov i IMS (The Issues of Designing Radiation-resistant Semiconductor Devices and IC), Moscow: TsNTI Poisk, 1988, pp. 16–19.
Myrova, L.O. and Chepizhenko, A.Z., Obespechenie stoikosti svyazi k ioniziruyushchim i elektromagnitnym izlucheniyam (Ensuring the Resistance of Communication Equipment Against Ionizing and Electromagnetic Radiation), Moscow: Radio i Svyaz’, 1988.
Astvatsatur’yan, E.R., Belyaev, V.A., and Skorobogatov, P.K., Using the Method of Criterion Functions for Theoretical Modeling and Experimental Study of Radiation Behavior of Primary Data Processing Hardware Based on IC with Grand Scale Integration, Tekh. Sredstv Svyazi, 1987, vol. 11, pp. 3–12.
Astvatsatur’yan, E.R., Golotyuk, O.N., Popov, Yu.A., et al., Metody povysheniya radiatsionnoi stoikosti elektronnykh skhem i ustroistv vychislitel’noi tekhniki (The Methods of Improving Radiation Resistance of Electronic Circuits and Computing Devices), Moscow: Mosk. Inzh.-Fiz. Inst., 1986.
Astvatsatur’yan, E.R., Ratkin, A.V., Skorobogatov, P.K., and Chumakov, A.I., Transient Ionizing Effects in Digital Integrated Circuits, Zarubezh. Elektron. Tekh., 1983, no. 9 (267), pp. 36–72.
Mesarović, M.D. and Takahara, Y., General Systems Theory: Mathematical Foundations, New York: Academic, 1975. Translated under the title Obshchaya teoriya sistem: matematicheskie osnovy, Moscow: Mir, 1978.
Astvatsatur’yan, E.R., Belyaev, V.A., and Trushkin, N.S., Functional-logical Modeling of Radiation Behavior of Digital Devices, Preprint of Moscow Engineering and Physics Inst., Moscow, 1993, no. 016-93.
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Original Russian Text © V.M. Barbashov, 2011, published in Datchiki i Sistemy, 2011, No. 6, pp. 29–34.
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Barbashov, V.M. Modeling of functional failures in digital systems under the radiation effect. Autom Remote Control 74, 671–678 (2013). https://doi.org/10.1134/S0005117913040097
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DOI: https://doi.org/10.1134/S0005117913040097