Skip to main content
Log in

Designing and controlling the metrological parameters of photoelectric transducers based on semiconductors with multiply-charged dopants

  • Sensors and Systems
  • Published:
Automation and Remote Control Aims and scope Submit manuscript

Abstract

The initial data for designing the metrological parameters of photoelectric semiconductor transducers (PST) based on semiconductors with deep multiply-charged dopants are obtained. The ranges of correspondence between the energy characteristic of PST with multiply-charged dopants and the linear operation mode are studied. It is demonstrated that an appropriate choice of a deep multiply-charged dopant enables designing an PST with a given pass band, an improved signal/noise ratio and a higher operating temperature. Moreover, it is shown that combining control and measuring optical channels in a single photodetector allows for implementing the control method for the PST spectral sensitivity during operation.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. Belokonev, V.M., Zavadskii, Yu.I., Kuznetsov, Yu.A., and Chernokozhin, V.V., Long-wave IR Silicium Photodetectors, Elektron. Promyshl., 2003, no. 2, pp. 169–175.

  2. GOST (State Standard) 17772-88: Semiconductor Radiation Detectors. Photoelectric and Photodetection Devices, 1988.

  3. GOST (State Standard) 25369-82: Measuring Photocells. The Basic Parameters. Measurement Methods for the Basic Parameters, 1982.

  4. Sah, C.T., et al., Computer-aided Study of Steady-state Carrier Lifetimes under Arbitrary Injection Conditions, Solid State Electron., 1979, vol. 22, pp. 921–926.

    Article  Google Scholar 

  5. Tkachev, V.D., Urenev, V.I., Shadurskaya, L.I., and Yavid, V.Yu., On Nonequilibrium Stationary Recombination Statistics in Semiconductors, Fiz. Tekh. Poluprovodnikov, 1978, vol. 12, no. 7, pp. 1393–1396.

    Google Scholar 

  6. Glinchuk, K.D. and Litovenko, N.M., Recombination Characteristics of Ge and Si Used in Semiconductor Engineering, Poluprovodn. Tekh. Mikroelektr., 1978, vol. 28, pp. 3–22.

    Google Scholar 

  7. Gusev, O.K., Shadurskaya, L.I., and Yarzhembitskaya, N.V., Modeling of Metrological Parameters of Photoelectric Transducers Based on Semiconductors with Deep Doping Agents, Metrol. Priborostr., 2008, no. 2, pp. 22–25.

  8. Gusev, O.K., Svistun, A.I., Shadurskaya, L.I., and Yarzhembitskaya, N.V., The Impact of Power Density of Optical Radiation on Dynamic Metrological Parameters of Photoelectric Semiconductor Transducers with Multiply-charged Doping Agents, Metrol. Priborostr., 2009, no. 3, pp. 14–18.

Download references

Author information

Authors and Affiliations

Authors

Additional information

Original Russian Text © O.K. Gusev, A.I. Svistun, L.I. Shadurskaya, N.V. Yarzhembitskaya, 2011, published in Datchiki i Sistemy, 2011, No. 1, pp. 19–23.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Gusev, O.K., Svistun, A.I., Shadurskaya, L.I. et al. Designing and controlling the metrological parameters of photoelectric transducers based on semiconductors with multiply-charged dopants. Autom Remote Control 74, 288–294 (2013). https://doi.org/10.1134/S0005117913020112

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S0005117913020112

Keywords

Navigation