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Estimating the latent time of fault detection in finite automaton tested in real time

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Abstract

The notions of potential and real latent times of fault detection in finite automata were introduced. The potential latent time is the minimal theoretical time of automaton fault detection, the real time is defined as the time of fault manifestation at a certain point. A method for determination of the statistical characteristics of both times for the automaton tested in the course of its real operation was proposed. It is based on selection of the trajectories of the Markov chain describing behavior of the operable and faulty automata. Additionally, a method for determination of the upper bound of the mean latent time in the case of limited information about the automaton characteristics was proposed.

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References

  1. Lala, P., Self-Checking and Fault Tolerant Digital Design, San Francisco: Morgan Kaufman, 2000.

    Google Scholar 

  2. Shedletsky, J. and McCluskey, E., The Error Latency of Fault in a Sequential Digital Circuit, IEEE Trans. Comput., 1976, vol. 25, no. 6, pp. 655–659.

    Article  MATH  MathSciNet  Google Scholar 

  3. Goot, R., Levin, I., and Ostanin, S., Fault Latencies of Concurrent Checking FSMs, in Proc. DSD 2002 Euromicro Sympos. Digital Syst. Design Architectures, Methods and Tools, Dortmund, pp. 174–179.

  4. Feller, W., An Introduction to Probability Theory and Its Applications, New York: Wiley, 1971.

    MATH  Google Scholar 

  5. Kemeny, J. and Snell, J., Finite Markov Chains, Princeton: Van Nostrand, 1967.

    Google Scholar 

  6. Nicolaidis, M. and Zorian, Y., On-line Testing for VLSI—A Compendium of Approaches, J. Electron. Testing: Theory Appl., 1998, no. 12, pp. 7–20.

  7. Levin, I. and Sinelnikov, V., Self-checking of FPGA based Control Units, in Proc. Great Lakes Sympos. VLSI, Ann Arbor: IEEE Press, 1999, pp. 292–295.

    Chapter  Google Scholar 

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Original Russian Text © R. Goot, I. Levin, 2008, published in Avtomatika i Telemekhanika, 2008, No. 10, pp. 128–141.

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Goot, R., Levin, I. Estimating the latent time of fault detection in finite automaton tested in real time. Autom Remote Control 69, 1765–1777 (2008). https://doi.org/10.1134/S000511790810010X

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  • DOI: https://doi.org/10.1134/S000511790810010X

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