Abstract
Methods for the calculation of correlations in the surface structure of solids are analyzed. A new approach is proposed based on determination of the mean reciprocal information for two-dimensional systems. The approach is applied to interpretation of the results of experimental investigation of the surface of amorphized hydrogenated silicon.
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Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 26, No. 15, 2000, pp. 53–57.
Original Russian Text Copyright © 2000 by Mursalov, Bodyagin, Vikhrov.
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Mursalov, S.M., Bodyagin, N.V. & Vikhrov, S.P. Calculation of correlations in the surface structure of solids. Tech. Phys. Lett. 26, 668–670 (2000). https://doi.org/10.1134/1.1307808
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DOI: https://doi.org/10.1134/1.1307808