Technical Physics

, Volume 63, Issue 12, pp 1800–1807 | Cite as

Effect of Low-Energy Ion-Plasma Treatment on Residual Stresses in Thin Chromium Films

  • A. S. BabushkinEmail author
  • I. V. UvarovEmail author
  • I. I. AmirovEmail author


The results of studying the effect of low-energy argon ion bombardment (~30 eV) on residual mechanical stresses in a thin chromium film are presented. The change in the mean value and stress gradient as a function of the ion bombardment duration was determined by the change in the bend of test micromechanical bridges and cantilevers. A method is proposed for calculating the depth of the stress modification in a film using these structures. It has been established that the long-term ion-plasma treatment at room temperature affects stresses at a depth of more than 100 nm.



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Copyright information

© Pleiades Publishing, Ltd. 2018

Authors and Affiliations

  1. 1.Institute of Physics and Technology, Yaroslavl Branch, Russian Academy of SciencesYaroslavlRussia

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