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Automation and Remote Control

, Volume 65, Issue 11, pp 1847–1859 | Cite as

Functional Tests for RISC-microprocessors

  • S. G. Sharshunov
Article

Abstract

The well-known models and concepts of functional testing of microprocessors are described. The properties of the RISC-architecture that aid in applying effective approaches to hardware testing are stated. Functional decomposition is used to develop a sequence of actions implemented in designing tests. Special attention is paid to testing of control units. The RISC-architecture has shown to be helpful in designing effective algorithms for testing at the architectural level. The designed procedures detect most of the defects in control circuits indirectly through data processing and storing devices without the use of control units.

Keywords

Mechanical Engineer System Theory Control Unit Functional Test Control Circuit 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© MAIK “Nauka/Interperiodica” 2004

Authors and Affiliations

  • S. G. Sharshunov
    • 1
  1. 1.Far Eastern State Academy of Economics and ManagementVladivostokRussia

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