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Measurement of the S-Parameters of 2n-Terminal Microwave Devices

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Measurement Techniques Aims and scope

Abstract

An algorithm for determining the S-parameters of 2n-terminal microwave devices from the S-parameters of six-terminal networks measured using a triple 12-terminal circuit analyzer is developed.

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Reference

  1. Weigan Liu and Chengli Ruan, IEEE Trans. Microwave Theory and Techniques, MTT-17, No. 4, 734 (1989).

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Ryasnyi, Y.V., Pal'chun, Y.A. Measurement of the S-Parameters of 2n-Terminal Microwave Devices. Measurement Techniques 44, 407–415 (2001). https://doi.org/10.1023/A:1010928116980

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  • DOI: https://doi.org/10.1023/A:1010928116980

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