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Automation and Remote Control

, Volume 62, Issue 4, pp 642–652 | Cite as

Self-Dual Self-Testing Multicycle Circuits: Their Properties

  • M. Gessel'
  • A. V. Dmitriev
  • V. V. Sapozhnikov
  • Vl. V. Sapozhnikov
Article
  • 25 Downloads

Abstract

Functional testing of memory circuits based on the properties of self-dual functions and a procedure for transforming the initial circuit into a self-dual circuit are described. Experimental results for MCNC benchmark circuits are given.

Keywords

Mechanical Engineer System Theory Functional Testing Benchmark Circuit Memory Circuit 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© MAIK “Nauka/Interperiodica” 2001

Authors and Affiliations

  • M. Gessel'
    • 1
  • A. V. Dmitriev
    • 2
  • V. V. Sapozhnikov
    • 2
  • Vl. V. Sapozhnikov
    • 2
  1. 1.University of PotsdamPotsdamGermany
  2. 2.St. Petersburg State Transport UniversitySt. PetersburgRussia

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