Abstract
Design of logical circuits for modulo tests in unitary parallel binary code is described. The complexity and speed of circuits designed by different methods are evaluated.
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Muzychenko, O.N. Logical Modulo Test Circuits: Their Design in Unitary Positional Binary Codes. Automation and Remote Control 62, 491–504 (2001). https://doi.org/10.1023/A:1002870514435
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DOI: https://doi.org/10.1023/A:1002870514435