Synthesis of Highly Oriented α-PbO2 Layers on the Surfaces of Single-Crystal Silicon and Quartz by Successive Ionic Layer Deposition
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Conditions for the synthesis of α-PbO2 layers on silica surfaces by successive ionic layer deposition were determined. These layers were studied by X-ray spectral microanalysis, X-ray diffraction, IR Fourier spectroscopy, UV-Vis spectroscopy, and ellipsometry.
KeywordsSpectroscopy Silicon Fourier Quartz Silica Surface
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