Infrared analyses of clay mineral samples are usually performed by transmission techniques. While transmission measurements are easy and inexpensive, the sample preparation plays a critical role in the quality of the data. Alternatively, attenuated total reflection (ATR) provides a powerful and often simpler analysis method. However, the ATR spectra reveal significant differences when compared to transmission spectra sometimes leading to confusion in the interpretations. Indeed, optical effects play a prominent role in the ATR spectral profile and their identification is mandatory for obtaining quantitative information regarding molecular/particle orientation or film thickness. The objective of the present study was to perform exact spectral simulations of montmorillonite films by making use of optical theory, including the determination of the anisotropic optical constants from the experimental reflectance spectra by Kramers-Kronig (KK) transformation. This methodology was used: (1) to choose the appropriate optical conditions for advanced and reliable characterization of clay minerals; (2) to extract quantitative information such as the estimation of the film thickness; and (3) to discriminate optical phenomena (optical interferences) from chemical/structural features of the sample.
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The CNRS interdisciplinary “défi Needs” funding program (Project DARIUS) is acknowledged for providing financial support for this study. The authors acknowledge financial support from the European Union (ERDF) and "Région Nouvelle Aquitaine." The authors thank J.W. Stucki (Editor-in-Chief), G. Chryssikos (Associate Editor), the anonymous reviewers, and C.T. Johnston for their comments which greatly improved the quality of the manuscript.
Conflict of Interest
The authors declare that they have no conflict of interest.
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Grégoire, B., Dazas, B., Leloup, M. et al. OPTICAL THEORY-BASED SIMULATION OF ATTENUATED TOTAL REFLECTION INFRARED SPECTRA OF MONTMORILLONITE FILMS. Clays Clay Miner. 68, 175–187 (2020). https://doi.org/10.1007/s42860-020-00073-x
- Attenuated total reflectance
- Clay minerals film
- Infrared optical constants
- Numerical simulation
- Thickness determination