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Cross-sectional investigation of radiation damage of 2 MeV proton-irradiated silicon carbide

  • Xu Wang
  • Yan-Wen Zhang
  • Dong Han
  • Yun-Biao Zhao
  • Zi-Qiang Zhao
  • Ming Zhang
Article
  • 79 Downloads

Abstract

Cross-sectional investigation is an important method to study ion irradiation effects in the depth direction. In this study, 2 MeV H+ was implanted in 6H-SiC single crystals to investigate the effects of light ion irradiation on SiC. Raman spectroscopy and scanning electronic microscopy (SEM) were carried out on cross-sectional samples to reveal the in-depth damage states and dopant behavior. The most damaged region is a little shallower than that predicted by the SRIM procedure, owing to the uncertainty in SRIM simulations. Layered structures representing zones of varying damage after 2 MeV H ion irradiation are clearly observed. Two bands are observed in SEM images, of which on band corresponds to the damage peak, while the other band at the end of the H ion-affected area is probably a result of H diffusion propelled by a hydrogen-rich layer during irradiation. A charge accumulation effect related with conductivity on the sample surfaces during SEM tests is observed in the H-implanted area. A model is proposed to explain these phenomena.

Keywords

SiC Proton irradiation Cross-sectional analysis Raman spectroscopy SEM 

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Copyright information

© Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Chinese Nuclear Society, Science Press China and Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Institute of MaterialsChina Academy of Engineering PhysicsJiangyouChina
  2. 2.Department of Nuclear PhysicsChina Institute of Atomic EnergyBeijingChina
  3. 3.State Key Laboratory of Nuclear Physics and Technology, Institute of Heavy Ion Physics, School of PhysicsPeking UniversityBeijingChina

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