Abstract
Chipping potatoes are bred for their ability to produce light-colored, defect-free chips. Chips with stem-end chip defect (SECD) have dark blemishes and are undesirable to consumers and chip processors. The heritability of SECD is not known and genetic loci linked to defect formation have not been identified. Chip processing varieties ‘Wauseon’ and ‘Lenape’ were crossed and tubers from parents and 191 progeny were evaluated over four years for chip color descriptors L*, a*, and b* and SECD score in January, March, and May. Broad sense heritability for SECD was 0.64 or greater at each sampling time. Genotype data were used to construct a 1282 cM linkage map. Nine quantitative trait loci (QTL) for SECD were detected, and seven overlapped QTL for chip color traits. The QTL identified are starting points for developing molecular markers that are used to select genotypes that produce light-colored chips and have resistance to SECD formation.
Resumen
Se hace mejoramiento para papas de fritura por su habilidad para producir hojuelas de color claro y libres de defectos. Las hojuelas con el defecto del extremo del tallo (SECD) tienen manchas oscuras y son indeseables para consumidores y procesadores de frituras. No se conoce la heredabilidad de SECD y no se han identificado los loci genéticos ligados a la formación del defecto. Se cruzaron las variedades para frituras Wauseon y Lenape y se evaluaron los tubérculos de los progenitores y de 191 progenies a lo largo de cuatro años para los descriptores del color de hojuelas L*, a* y b* y a la lectura de SECD en enero, marzo y mayo. La heredabilidad de amplio sentido para SECD fue de 0.64 o mayor en cada tiempo de muestreo. Se usaron los datos del genotipo para construir un mapa de ligamiento de 1282 cM. Se detectaron nueve loci de trazos cuantitativos (QTL) para SECD, y siete QTL empalmados para características de color de la hojuela. Los QTL identificados son puntos de inicio para desarrollar marcadores moleculares que se usan para seleccionar genotipos que producen hojuelas de color claro y que tienen resistencia a la formación de SECD.
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Acknowledgements
The authors are grateful to Dr. James Busse for assistance with sample collection and processing. Assistance from the staff at the Hancock Research Station and Hancock Storage Research Facility was greatly appreciated. USDA-NIFA-SCRI Grant No. 2011-51181-30629 (Improved Breeding and Variety Evaluation Methods to Reduce Acrylamide Content and Increase Quality in Processed Potato Products) and the Wisconsin Potato and Vegetable Growers Association Chip Committee provided financial support for this project.
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Frederick, C.M., Bethke, P.C. Identification of Quantitative Trait Loci for Stem-End Chip Defect and Potato Chip Color Traits in a ‘Lenape’-Derived Full-Sib Population. Am. J. Potato Res. 96, 564–577 (2019). https://doi.org/10.1007/s12230-019-09746-3
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DOI: https://doi.org/10.1007/s12230-019-09746-3