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The online version of the original article can be found at http://dx.doi.org/10.1007/s12206-017-1037-9
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Kim, Y. Erratum to “Precision interferometric surface metrology of transparent thin film using wavelength tuning”. J Mech Sci Technol 32, 3487 (2018). https://doi.org/10.1007/s12206-018-0653-3
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DOI: https://doi.org/10.1007/s12206-018-0653-3