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Frontiers of Optoelectronics

, Volume 9, Issue 4, pp 549–554 | Cite as

Optical performance of ultra-thin silver films under the attenuated total reflection mode

  • Ming Zhou
  • Sheng Zhou
  • Gang Chen
  • Yaopeng Li
  • Dingquan Liu
Research Article
  • 69 Downloads

Abstract

Ultra-thin silver films were deposited by thermal evaporation, and the dielectric functions of samples were simulated using Drude-Lorentz oscillators. When s-polarized incident light from the BK7 glass into thin silver film at 45° angle using attenuated total reflection (ATR) mode, we experimental observed that the reflection reach a minimum of 1.87% at 520 nm for thickness of d~6.3 nm silver film, and it reach a minimum of 10.1% at 500 nm for thickness of d~4.1 nm. Moreover, we simulated the absorption changes with incident angles at 520 nm for both p-polarized (TM wave) and s-polarized (TE wave) light using transfer matrix theory, and calculated the electric field distributions. The absorption as a function of incident angles of TM wave and TE wave showed different characteristics under ATR mode, TE wave reached the maximum absorption around the critical angle θc~41.1°, while TM wave reached the minimum absorption.

Keywords

silver films transfer matrix theory absorption ellipsometer 

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Copyright information

© Higher Education Press and Springer-Verlag Berlin Heidelberg 2016

Authors and Affiliations

  • Ming Zhou
    • 1
  • Sheng Zhou
    • 1
  • Gang Chen
    • 1
  • Yaopeng Li
    • 1
  • Dingquan Liu
    • 1
    • 2
  1. 1.Shanghai Institute of Technical PhysicsChinese Academy of SciencesShanghaiChina
  2. 2.School of Physical Science and TechnologyShanghaiTech UniversityShanghaiChina

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