Advertisement

Frontiers of Optoelectronics

, Volume 9, Issue 4, pp 555–559 | Cite as

Junction temperature measurement of alternating current light-emitting-diode by threshold voltage method

  • Ran Yao
  • Dawei Zhang
  • Bing Zou
  • Jian Xu
Research Article

Abstract

Junction temperature of alternating current light-emitting-diode (AC-LED) has a significant effect on its stable light output and lifetime. The threshold voltage measurement is employed to characterize the junction temperature of AC-LED, due to its excellent merits in high efficiency and accuracy. The threshold voltage is measured when the driving current of an AC-LED rises to a reference on-set value from the zero-crossing node. Based on multiple measurements of threshold voltage at different temperatures, a linear relationship was uncovered between the threshold voltage and the junction temperature of AC-LED with the correlating factor of temperature sensitive parameter (TSP). Thereby, we can calculate the junction temperature with the TSP and threshold voltage once the AC-LED stays at thermal equilibrium state. The accuracy of the proposed junction temperature measurement technique was found to be ±3.2°C for the reference current of 1 mA. It is concluded that the method of threshold voltage is accurate and simple to implement, making it highly suitable for measuring the junction temperature of AC-LED in industry.

Keywords

optoelectronics junction temperature measurement threshold voltage method alternating current light-emitting-diode (AC-LED) 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    Yen H, Kuo H, Yeh W. Characteristics of single-chip GaN-based alternating current light-emitting diode. Japanese Journal of Applied Physics, 2008, 47(12): 8808–8810CrossRefGoogle Scholar
  2. 2.
    EIA/JEDEC STANDARD Integrated Circuits Thermal Measurement Method- Electrical Test Method (Single Semiconductor Device). 1995Google Scholar
  3. 3.
    Xi Y, Schubert E F. Junction–temperature measurement in GaN ultraviolet light-emitting diodes using diode forward voltage method. Applied Physics Letters, 2004, 85(12): 2163–2165CrossRefGoogle Scholar
  4. 4.
    Shin MW, Jang S H. Thermal analysis of high power LED packages under the alternating current operation. Solid-State Electronics, 2012, 68: 48–50CrossRefGoogle Scholar
  5. 5.
    Liu Y, Jayawardena A, Klein T R, Narendran N. Estimating the junction temperature of AC LEDs. Proceedings of SPIE, 2010, 7784: 778409CrossRefGoogle Scholar
  6. 6.
    Jayawardena A, Liu Y, Narendran N. Analysis of three different junction temperature estimation methods for AC LEDs. Solid-State Electronics, 2013, 86: 11–16CrossRefGoogle Scholar
  7. 7.
    Keppens A, Ryckaert W R, Deconinck G, Hanselaer P. High power light-emitting diode junction temperature determination from current-voltage characteristics. Journal of Applied Physics, 2008, 104(9): 093104CrossRefGoogle Scholar
  8. 8.
    Wu B, Lin S, Shih T M, Gao Y, Lu Y, Zhu L, Chen G, Chen Z. Junction-temperature determination in InGaN light-emitting diodes using reverse current method. IEEE Transactions on Electron Devices, 2013, 60(1): 241–245CrossRefGoogle Scholar
  9. 9.
    Neamen D A. Semiconductor Physics and Devices Basic Principles. 3rd ed. New York: McGraw-Hill, 2003Google Scholar
  10. 10.
    Poppe A, Siegal B, Farkas G. Issues of thermal testing of AC LEDs. In: Proceedings of 27th Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2011, 297–303Google Scholar

Copyright information

© Higher Education Press and Springer-Verlag Berlin Heidelberg 2016

Authors and Affiliations

  1. 1.Engineering Research Center of Optical Instrument and System, Ministry of EducationUniversity of Shanghai for Science and TechnologyShanghaiChina
  2. 2.Department of Engineering Science and MechanicsPennsylvania State UniversityUniversity ParkUSA

Personalised recommendations