Journal of Failure Analysis and Prevention

, Volume 16, Issue 2, pp 197–199 | Cite as

Product News


Scanning Electron Microscope Features Expanded EDS Analysis, Hi-Res Imaging

Jeol USA introduces the JSM-IT100 InTouchScope scanning electron microscope, which features expanded EDS analysis capabilities and ports for multiple detectors. The latest addition to the InTouchScope Series, it is a simple-to-use, versatile, research-grade SEM with a compact ergonomic design. A versatile workhorse SEM that can be configured to meet individual lab requirements, it offers high-resolution imaging and a range of acceleration voltages at both high- and low-vacuum modes.

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