Field SEM Released with Expanded Features
Carl Zeiss Microscopy has introduced an extension of its field emission scanning electron microscope (FE-SEM) platform Merlin. The plug-and-play feature allows customers to add and change detectors with minimum effort to handle tasks ranging from simple image capture to extensive material analysis. A large frame store of 32 × 24 k pixels allows imaging of very large areas. New features include in-situ three-dimensional (3-D) surface reconstruction and calculation of 3-D data from 2-D data.