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Journal of Failure Analysis and Prevention

, Volume 8, Issue 1, pp 20–22 | Cite as

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Research Facility Planned for Atom Probe Tomography

The University of Alabama and Imago Scientific Instruments plan to establish a new research facility for atom probe tomography. LEAP microscopy, also known as atom probe tomography, allows materials research scientists to analyze specimens in three dimensions with atomic resolution, offering key insights into how a material’s atomic structure affects its mechanical and electrical properties. LEAP is ideal for studying semiconductors, the base materials used in manufacturing computer chips and other electronic devices.

“Working at the nanolevel and being able to identify the type, location, and spatial position of atoms helps us to better engineer materials,” said Dr. Gregory Thompson, assistant professor of metallurgical and materials engineering at the University of Alabama. “Through LEAP’s analysis, researchers can better design materials with tailored properties for such applications as transistors used in cell phones, hard drives...

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