Abstract
Both low-frequency noises and electrically active defects have been investigated for two technological variants, i.e. optimized and non-optimized, of the HgCdTe p on n technology applied to the mid-wave infrared blue band with a cut-off wavelength of 4.2 μm. This has been achieved using electro-optical characterizations and the deep level transient spectroscopy (DLTS) technique. The results show that the impact of extra 1/f and random telegraph signal noises has been reduced with the optimization of the technology. Furthermore, a broadened DLTS peak, probably related to dislocations in the material, has been found for both variants, the relative amplitude of which is reduced in the optimized case. The potential correlation between low-frequency noises and this broadened peak is discussed.
Similar content being viewed by others
References
M.A. Kinch, F. Aqariden, D. Chandra, P.K. Liao, H.F. Schaake, and H.D. Shih, J. Electron. Mater. 34, 880 (2005).
S. Tobin, S. Iwasa, and T. Tredwell, IEEE Trans. Electron. Devices 27, 43 (1980).
S. Machlup, J. Appl. Phys. 25, 341 (1954).
S.T. Hsu, Solid State Electron. 14, 487 (1971).
A. Brunner, L. Rubaldo, V. Destefanis, F. Chabuel, A. Kerlain, D. Bauza, and N. Baier, J. Electron. Mater. 43, 3060 (2014).
A.L. McWhorter, Semiconductor Surface Physics, ed. R.H. Kingston (Philadelphia: University of Pennsilvania, 1975).
N.F. Hooge, Phys. Lett. A 29, 139 (1969).
A. Kerlain, A. Brunner, D. Sam-Giao, N. Pére-Laperne, L. Rubaldo, V. Destefanis, F. Rochette, and C. Cervera, J. Electron. Mater. 45, 4557 (2016).
S. Kogan, Electronic Noise and Fluctuations in Solids, 1st ed. (New York: Cambridge University Press, 1996).
D.V. Lang, J. Appl. Phys. 45, 3025 (1974).
T. Wosiński, J. Appl. Phys. 65, 1566 (1989).
D. Cavalcoli, A. Cavallini, and E. Gombia, Phys. Rev. B 56, 10208 (1997).
J.F. Barbot, Phys. Status Solidi (a) 124, 513 (1991).
L. Rubaldo, A. Brunner, J. Berthoz, N. Péré-Laperne, A. Kerlain, P. Abraham, D. Bauza, G. Reimbold, and O. Gravand, J. Electron. Mater. 43, 3065 (2014).
A. Brunner, L. Rubaldo, J. Berthoz, D. Bauza, and G. Reimbold, Low Temperature Electronics, 11th International Workshop on (2014).
S. Weiss and R. Kassing, J. Appl. Phys. 31, 1733 (1988).
W. Schröter, J. Kronewitz, U. Gnauert, F. Riedel, and M. Seibt, Phys. Rev. B 52, 13726 (1995).
W. Schröter, V. Kveder, M. Seibt, H. Ewe, H. Hedemann, F. Riedel, and A. Sattler, Mater. Sci. Eng., B 72, 80 (2000).
Author information
Authors and Affiliations
Corresponding author
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
About this article
Cite this article
Guinedor, P., Brunner, A., Rubaldo, L. et al. Low-Frequency Noises and DLTS Studies in HgCdTe MWIR Photodiodes. J. Electron. Mater. 48, 6113–6117 (2019). https://doi.org/10.1007/s11664-019-07213-7
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11664-019-07213-7