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Journal of Computer Science and Technology

, Volume 27, Issue 5, pp 979–988 | Cite as

Coverage Optimization for Defect-Tolerance Logic Mapping on Nanoelectronic Crossbar Architectures

  • Bo Yuan
  • Bin LiEmail author
Regular Paper

Abstract

Emerging nano-devices with the corresponding nano-architectures are expected to supplement or even replace conventional lithography-based CMOS integrated circuits, while, they are also facing the serious challenge of high defect rates. In this paper, a new weighted coverage is defined as one of the most important evaluation criteria of various defecttolerance logic mapping algorithms for nanoelectronic crossbar architectures functional design. This new criterion is proved by experiments that it can calculate the number of crossbar modules required by the given logic function more accurately than the previous one presented by Yellambalase et al. Based on the new criterion, a new effective mapping algorithm based on genetic algorithm (GA) is proposed. Compared with the state-of-the-art greedy mapping algorithm, the proposed algorithm shows pretty good effectiveness and robustness in experiments on testing problems of various scales and defect rates, and superior performances are observed on problems of large scales and high defect rates.

Keywords

coverage optimization defect-tolerance nanoelectronic crossbar logic mapping evolutionary algorithm 

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Supplementary material

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Copyright information

© Springer Science+Business Media New York & Science Press, China 2012

Authors and Affiliations

  1. 1.Natural Inspired Computation and Applications Lab, Joint USTC-Birmingham Research Institute in Intelligent Computation and Its ApplicationsUniversity of Science and Technology of ChinaHefeiChina

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