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Journal of Computer Science and Technology

, Volume 20, Issue 2, pp 201–209 | Cite as

Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Tester Channels Reduction

  • Yin-He HanEmail author
  • Xiao-Wei Li
  • Hua-Wei Li
  • Anshuman Chandra
Article

Abstract

This paper presents a test resource partitioning technique based on an efficient response compaction design~called quotient compactor(q-Compactor). Because q-Compactor is a single-output compactor, high compaction ratios can be obtained even for chips with a small number of outputs. Some theorems for the design of q-Compactor are presented~to achieve full diagnostic ability, minimize error cancellation and handle unknown bits in the outputs of the circuit under test (CUT). The q-Compactor can also be moved to the load-board, so as to compact the output response of the CUT even during functional testing. Therefore, the number of tester channels required to test the chip is significantly reduced. The experimental results on the ISCAS ‘89 benchmark circuits and an MPEG 2 decoder SoC show that the proposed compaction scheme is very efficient.

Keywords

System-on-a-Chip (SoC) test resource partitioning (TRP) response compaction diagnose error cancellation 

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Copyright information

© Springer Science + Business Media, Inc. 2005

Authors and Affiliations

  • Yin-He Han
    • 1
    • 2
    Email author
  • Xiao-Wei Li
    • 1
    • 2
  • Hua-Wei Li
    • 1
  • Anshuman Chandra
    • 3
  1. 1.Institute of Computing TechnologyChinese Academy of SciencesBeijingP.R. China
  2. 2.Graduate School of Chinese Academy of SciencesBeijingP.R. China
  3. 3.Synopsys, Inc.Mountain ViewU.S.A.

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