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Journal of Computer Science and Technology

, Volume 20, Issue 2, pp 187–194 | Cite as

Fault Diagnosis of Physical Defects Using Unknown Behavior Model

  • Xiao-Qing WenEmail author
  • Hideo Tamamoto
  • Kewal K. Saluja
  • Kozo Kinoshita
Article

Abstract

A new fault model, called the X-fault model, is proposed for fault diagnosis of physical defects with unknown behaviors by using X symbols. An efficient X-fault simulation method and an efficient X-fault diagnostic reasoning method are presented. Fault diagnosis based on the X-fault model can improve the accuracy of failure analysis for a wide range of physical defects in complex and deep submicron integrated circuits.

Keywords

Information System Artificial Intelligence Data Structure Information Theory Simulation Method 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science + Business Media, Inc. 2005

Authors and Affiliations

  • Xiao-Qing Wen
    • 1
    Email author
  • Hideo Tamamoto
    • 2
  • Kewal K. Saluja
    • 3
  • Kozo Kinoshita
    • 4
  1. 1.Department of CSEKyushu Institute of TechnologyIizuka, Fukuoka820-8502Japan
  2. 2.Department of Information EngineeringAkita UniversityAkitaJapan
  3. 3.Department of ECEUniversity of WisconsinMadisonU.S.A.
  4. 4.Faculty of InformaticsOsaka Gakuin UniversitySuita, OsakaJapan

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