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Journal of Computer Science and Technology

, Volume 20, Issue 2, pp 175–186 | Cite as

VFSim: Concurrent Fault Simulation at Register Transfer Level

Article

Abstract

VLSI testing is being pushed to the high-level based technology. In this paper a Verilog Register transfer level Model (VRM) for integrated circuits is proposed. The model provides a text format file, which is convenient and more practical for developing succeeding Register Transfer Level (RTL) test tools, such as fault simulation, test pattern generation and so forth. Based on the VRM, an RTL concurrent fault simulation approach is presented. After RTL fault models and super faults defined, the concurrent fault simulation algorithm is given. The corresponding RTL concurrent fault simulator, VFSim, was implemented. The initial experiments show that the RTL fault simulator is efficient for VLSI circuits.

Keywords

high-level testing Verilog RTL circuit modeling fault model concurrent fault simulation 

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Copyright information

© Springer Science + Business Media, Inc. 2005

Authors and Affiliations

  1. 1.Institute of Computing TechnologyChinese Academy of SciencesBeijingP.R. China

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