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Russian Physics Journal

, Volume 57, Issue 9, pp 1287–1293 | Cite as

Increase in the Sensitivity and Selectivity of Semiconductor Gas Sensors

  • T. R. Muksunov
  • N. K. Maksimova
  • E. Yu. Sevast’yanov
  • S. É. Shipilov
  • V. P. Yakubov
Article

Within the limits of a linear model based on processing of data of direct calibration measurements with semiconductor multisensors, a method of their calibration by standard levels of gas concentration is substantiated for its subsequent application for small concentration levels. On an example of data for nitrogen dioxide, the notion of the normalized surface density of the gas is introduced, and its relationship with the volume concentration is established. On this basis, the feasibility of increase in the sensitivity and selectivity of the multisensor system by several orders of magnitude compared with the existing instrumental methods is substantiated by imitational modeling using mathematical methods of modern algebra and regularization theory.

Keywords

normalized surface density calibration method of singular expansion sensitivity selectivity 

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References

  1. 1.
    L. Buck and R. Axel, Cell, 65, 175–187 (1991).CrossRefGoogle Scholar
  2. 2.
    K. Persaud and G. Dodd, Nature, 299, 352–355 (1982).ADSCrossRefGoogle Scholar
  3. 3.
    N. V. Dolgopolov and M. Yablokov, Mir Bezop., No. 3, 54–59 (2007).Google Scholar
  4. 4.
    O. V. Anisimov, V. I. Gaman, N. K. Maksimova, et al., Fiz. Tekh. Poluprovodn., 44, No. 3, 383–389 (2010).Google Scholar
  5. 5.
    Y. Noboru and S. Kengo, Sensors and Actuators, B128, No. 2, 566–573 (2008).Google Scholar
  6. 6.
    G. E. Forsythe, M. Malcolm, and K. Moler, Computer Methods of Mathematical Calculations [Russian translation], Mir, Moscow (1980).Google Scholar
  7. 7.
    C. Lawson and R. Hanson, Numerical Solution of Least Squares Problems [Russian translation], Nauka, Moscow (1986).Google Scholar
  8. 8.
    V. P. Yakubov, Doppler Very-Long-Baseline Interpherometry [in Russian], Vodolei, Tomsk (1997).Google Scholar

Copyright information

© Springer Science+Business Media New York 2015

Authors and Affiliations

  • T. R. Muksunov
    • 1
  • N. K. Maksimova
    • 1
  • E. Yu. Sevast’yanov
    • 1
  • S. É. Shipilov
    • 1
  • V. P. Yakubov
    • 1
  1. 1.V. D. Kuznetsov Siberian Physical-Technical Institute at Tomsk State UniversityTomskRussia

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