Abstract
The stress, vertical deflection, and nonlinear piezoresistive response of square membranes are measured with the aim of identifying the validity range of a calculation procedure devised in our previous study. Maximum values of the pressure parameter are determined up to which close agreement exists between measured and calculated values.
Similar content being viewed by others
REFERENCES
Meier-Scheider, D., Maibach, J., and Obermeier, E., Computer-Aided Characterization of the Elastic Properties of Thin Films, J. Micromech. Microeng., 1992, vol. 2, pp. 173–175.
Malhaire, C., Le Berre, M., Febvre, D., Barbier, D., and Pinard, P., Effect of Clamping Conditions and Built-in Stresses on the Thermopneumatic Deflection of SiO2/Si Membranes with Various Geometries, Sens. Actuators, 1999, vol. 74, pp. 174–177.
Pancewicz, T., Jechomicz, R., Jniazdomski, Z., Azgin, Z., and Komalski, P., The Empirical Verification of the FEM Model of Semiconductor Pressure Sensors, Sens. Actuators, 1999, vol. 76, pp. 260–265.
Chouaf, A., Malhaire, C., Le Berre, M., Dupeux, M., Pourroy, F., and Barbier, D., Stress Analysis at Singular Points of Micromachined Silicon Membranes, Sens. Actuators, 2000, vol. 84, pp. 109–115.
Steinmann, R., Friemann, H., Prescher, C., and Shellin, R., Mechanical Behaviour of Micromachined Sensor Membranes under Uniform External Pressure Affected by In-plane Stresses Using a Ritz Method and Hermite Polynomials, Sens. Actuators, A, 1995, vol. 48, pp. 37–46.
Gridchin, V.A., Lubimsky, V.M., and Shaporin, A.V., Nonlinear Response of a Rectangular Membrane Sensing Element, Mikroelektronika, 2003, vol. 32, no.4, pp. 294–304.
Lubimsky, V.M., Ivanov, V.A., and Shaporin, A.V., Edge Stresses in the Membrane of a Pressure Sensor, in Trudy V mezhdunarodnoi konferentsii “Aktual’nye problemy elektronnogo priborostroeniya” APEP-2000 (Proc. 5th Int. Conf. on Current Issues of Electronic Instrumentation, APEP-2000), Novosibirsk, 2000, vol. 7, pp. 71–79.
Gridchin, V.A., Grichenko, V.V., and Lubimsky, V.M., Account and Experimental Researches of Strain in Square Diaphragm, in The Third IEEE-Russia Conference on Microwave Electronics: Measurements, Identification, Application (MEMIA’2001), Novosibirsk, 2001, pp. 127–134.
Gridchin, V.A. and Lubimsky, V.M., Phenomenological Model of the Piezoresistive Effect in Polysilicon Films, Mikroelektronika, 2003, vol. 32, no.4, pp. 261–270.
Granveaud, M. and Malsan, P., Piezoresistivite d’elements diffuses en silicium, L’Onde Electrique, 1967, vol. 47, pp. 392–401.
Author information
Authors and Affiliations
Additional information
__________
Translated from Mikroelektronika, Vol. 34, No. 3, 2005, pp. 210–217.
Original Russian Text Copyright © 2005 by Gridchin, Grichenko, Lubimsky.
Rights and permissions
About this article
Cite this article
Gridchin, V.A., Grichenko, V.V. & Lubimsky, V.M. Square-Membrane Deflection and Stress: Identifying the Validity Range of a Calculation Procedure. Russ Microelectron 34, 173–180 (2005). https://doi.org/10.1007/s11180-005-0026-3
Received:
Issue Date:
DOI: https://doi.org/10.1007/s11180-005-0026-3