Abstract
A correlation between the recombination rate constant of free electrons and holes (k r) and the band gap (E g) of semiconductors (AgCl, AgBr, CdxZn1−x S, CdSe, CdTe, and their solid solutions) at 295 K was found. The experimental data were obtained by the UHF photoconductivity (36 GHz) using current carrier generation by laser pulses (λ = 337 nm, pulse duration 8 ns). A decrease in E g in a range of 1.5–3 eV increases k r by 1.5 orders of magnitude according to the law close to exponential.
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Published in Russian in Izvestiya Akademii Nauk. Seriya Khimicheskaya, No. 5, pp. 856–860, May, 2007.
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Novikov, G.F., Radychev, N.A. Experimental determination of the dependence of the free electron—hole recombination rate constant on the band gap in semiconductors of the AIIBVI and AIBVII types. Russ Chem Bull 56, 890–894 (2007). https://doi.org/10.1007/s11172-007-0134-9
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DOI: https://doi.org/10.1007/s11172-007-0134-9