Synthesis and effect of post-deposition thermal annealing on morphological and optical properties of ZnO thin film
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Zinc oxide thin films have been deposited on glass substrates by the chemical bath deposition method; a surfactant, cetyltrimethylammonium bromide (CTAB); was used as capping agent. The films were annealed at two different temperatures: 200 and 300 °C. The structural features were investigated by X-ray diffraction analysis which exhibited hexagonal wurtzite structures along with c-axis orientations. Crystallite size was estimated and found to be around 33–41 nm. The effect of post-deposition thermal annealing on the morphological and optical properties has been investigated by scanning electron microscopy and photoluminescence spectra at room temperature. The band gap energies of uncapped and CTAB-capped ZnO films were found to be 3.28 and 3.48 eV, respectively.
KeywordsZnO thin film Post-deposition thermal annealing CTAB Chemical bath deposition
A.K.S. extends his gratitude towards University Grants Commission, India, for the financial assistance in the form of a project [F. no. 40-99/2011(SR)]. We are grateful to UGC-DAE-IUC Indore, India for extending laboratory facilities for XRD, and to IIT Kanpur, India for SEM and PL studies.
- 4.P. Kathirvel, D. Manoharan, S.M. Mohan, S. Kumar, Spectral investigation of chemical bath deposited. Zinc oxide thin films–ammonia gas sensor. J Optoelectron Biomed Mater 1, 25–33 (2009)Google Scholar
- 17.Z.W. Liu, J.F. Gu, C.W. Sun, Q.Y. Zhang, Study on nucleation and dynamic scaling of morphological evolution of ZnO film deposition by reactive magnetron sputtering. Wuli Xuebao 55, 1965–1973 (2006)Google Scholar
- 25.M. Caglar, Y. Caglar, S. Ilican, The determination of the thickness and optical constants of the ZnO crystalline thin film by using envelope method. J. Optoelectron. Adv. Mater. 8, 1410–1413 (2006)Google Scholar
- 28.B.D. Cullity, Elements of X-ray diffraction, 2nd edn. (Addison-Wesley Company, Menlo Park), p. 102Google Scholar