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Radiophysics and Quantum Electronics

, Volume 57, Issue 8–9, pp 551–558 | Cite as

Achievement of Superresolution in Optical-Thickness Measurement and Statistical Localization of Fluorophores in Holographic and Fluorescent Microscopy

  • V. V. Dudenkova
  • M. S. Murav’eva
  • A. I. Rybnikov
  • Yu. N. Zakharov
Article

We present the concept of combining the holographic and localization fluorescent microscopy. The ways to optimize the optical schemes and image recording regimes in the process of combining such interferometric and statistical methods are developed, which makes it possible to study the dynamics of the internal cell structure with transverse and longitudinal superresolution.

Keywords

Phase Portrait Reference Beam CMOS Camera Digital Holography Excitation Radiation 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 2015

Authors and Affiliations

  • V. V. Dudenkova
    • 1
  • M. S. Murav’eva
    • 1
  • A. I. Rybnikov
    • 1
  • Yu. N. Zakharov
    • 1
  1. 1.N. I. Lobachevsky State University of Nizhny NovgorodNizhny NovgorodRussia

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