A control chart for an exponential distribution using multiple dependent state sampling
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In this paper, we will present a control chart for exponentially distributed quality characteristics using multiple dependent state sampling. The proposed control chart has double control limits with two control coefficients, which is based on a normal approximation through transformation. The control coefficients are determined by considering the average run length (ARL) when the process is in control. The ARL for the shifted process is reported according to various shift ratios. The efficiency of the proposed control chart over the existing t-chart is compared in terms of the ARL.
Keywordst-chart Multiple dependent sampling Average run length
The authors are deeply thankful to the Editor and anonymous reviewers for their valuable suggestions to improve the quality of this manuscript.
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