Reduced basis method for the electromagnetic scattering problem: a case study for FinFETs

  • Martin Hammerschmidt
  • Sven Herrmann
  • Sven Burger
  • Jan Pomplun
  • Frank Schmidt
Part of the following topical collections:
  1. 2015 Conference on “Numerical Simulation of Optoelectronic Devices”


Optical 3D simulations in many-query and real-time contexts require new solution strategies. We study an adaptive, error controlled reduced basis method for solving parameterized time-harmonic optical scattering problems. Application fields are, among others, design and optimization problems of nano-optical devices as well as inverse problems for parameter reconstructions occurring e. g. in optical metrology. The reduced basis method presented here relies on a finite element modeling of the scattering problem with parameterization of materials, geometries and sources.


Finite element method Reduced basis method Electromagnetic field Model reduction Optical critical dimension metrology 



The results were obtained at the Berlin Joint Lab for Optical Simulations for Energy Research (BerOSE) of Helmholtz-Zentrum Berlin für Materialien und Energie, Zuse Institute Berlin and Freie Universität Berlin. This research was carried out in the framework of Matheon supported by Einstein Foundation Berlin through ECMath within subprojects SE6 and OT5.


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Copyright information

© Springer Science+Business Media New York 2016

Authors and Affiliations

  1. 1.Zuse Institute BerlinBerlinGermany
  2. 2.JCMwave GmbHBerlinGermany

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