Optical properties of an opal with a planar defect fabricated by inverse Schaefer and Langmuir–Blodgett techniques
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A silica monolayer has been introduced between tow artificial silica opals using Langmuir Blodgett and inverse Schaefer transfer techniques. The structure and optical properties of the sandwich structure have been characterized by atomic force microscopy, scanning electron microscopy and specular reflection and transmission spectra. The quality of the defect mode inside the stopband made by inverse Schaefer technique is as good as the one obtained by the most commonly used Langmuir–Blodgett technique. Finite difference time domain simulations have been performed and show very good agreement with experimental result.
Keywords3D photonic crystals Defect layer Specular reflection spectroscopy
The authors would like to thank Eric Charron (INSP) for the work on the goniometer setup, Emmanuelle Lacaze (INSP) for AFM measurements, Dominique Demaille (INSP) for SEM measurements, Nébéwia Griffete and Claire Mangeney (ITODYS) for their helps on functionalization of silica particles. Kifle Aregahegn and Juan-Sebastian Restrepo for their contributions, during their internship in INSP, respectively on synthesis of silica particles and opals and on simulations. The collaboration between INSP and IMS was supported by a Projet International de Coopération Scientifique (PICS 5724) between CNRS and VAST.
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