Low-Frequency Noise Characterization in Charge-Based Coherent Nanodevices
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Low-frequency noise has been recognized as the main mechanism of decoherence in present-day solid state coherent nanodevices. Often low-frequency noise has a 1/f spectrum, thus the responsible degrees of freedom are almost static during the coherent time evolution of the device. Their effect is to reduce the amplitude of the measured signal by an effect analogous to inhomogeneous broadening in NMR. Here we present a way to characterize effects of adiabatic noise exploiting the tunability of nanodevices. The results apply in principle to many implementations of quantum bits, and are particularly suited for solid state devices. The accurate characterization of the physics of the noise sources represents the first step toward the design specific strategies to eliminate their effects.
KeywordsNoise Source Quantum Noise Spontaneous Decay Exact Diagonalization Solid State Device
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